发明名称 Method for manufacturing a wiring contact portion of a semiconductor device
摘要 <p>The invention provides a device having a semiconductor layer (11), an insulating layer (13) on the semiconductor layer (11), including a discontinuity therein, a monocrystalline silicon layer (20) on a portion of the semiconductor layer (11) defined by the discontinuity, a non-monocrystalline silicon layer (21) on the monocrystalline silicon layer (20), and a wiring layer (22) on the non-monocrystalline silicon layer (21).</p>
申请公布号 EP0415537(B1) 申请公布日期 1997.11.26
申请号 EP19900307826 申请日期 1990.07.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SAMATA, SHUICHI;MATSUSHITA, YOSHIAKI
分类号 H01L21/28;H01L21/285;H01L23/532;H01L29/43;(IPC1-7):H01L21/20;H01L21/768 主分类号 H01L21/28
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