发明名称 VPP DETECTOR OF SEMICONDUCTOR MEMORY DEVICE
摘要 A circuit for detecting pull-up level is provided to exactly detect irrelevant to variably input the pull-up voltage. The circuit comprises a pull-up transistor to control switching by the pull-up voltage and a pull-down transistor to control switching by the pull-up voltage. A voltage level of an output node(6) is decided according to the pull-up voltage(Vpp). Therefore, an output of invertor(12) is changed at the Vpp by controlling the trap level of the invertor(12). Thereby, it is possible to exactly detect irrelevant to variably input of the pull-up voltage(Vpp).
申请公布号 KR0124046(B1) 申请公布日期 1997.11.25
申请号 KR19930024669 申请日期 1993.11.18
申请人 SAMSUNG ELECTRONICS CO.,LTD 发明人 KIM, HYUNG-DONG;PARK, CHAN-JONG
分类号 H01L27/10;G01R19/165;G11C5/14;G11C8/08;H03K5/08;(IPC1-7):H01L27/10 主分类号 H01L27/10
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