发明名称 |
VPP DETECTOR OF SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A circuit for detecting pull-up level is provided to exactly detect irrelevant to variably input the pull-up voltage. The circuit comprises a pull-up transistor to control switching by the pull-up voltage and a pull-down transistor to control switching by the pull-up voltage. A voltage level of an output node(6) is decided according to the pull-up voltage(Vpp). Therefore, an output of invertor(12) is changed at the Vpp by controlling the trap level of the invertor(12). Thereby, it is possible to exactly detect irrelevant to variably input of the pull-up voltage(Vpp).
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申请公布号 |
KR0124046(B1) |
申请公布日期 |
1997.11.25 |
申请号 |
KR19930024669 |
申请日期 |
1993.11.18 |
申请人 |
SAMSUNG ELECTRONICS CO.,LTD |
发明人 |
KIM, HYUNG-DONG;PARK, CHAN-JONG |
分类号 |
H01L27/10;G01R19/165;G11C5/14;G11C8/08;H03K5/08;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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