发明名称 Spiral grooved polishing pad for chemical-mechanical planarization of semiconductor wafers
摘要 The present invention is a polishing pad for use in chemical-mechanical planarization of semiconductor wafers by placing a wafer against a polishing surface of the polishing pad while rotating the polishing pad about its center in the presence of a polishing slurry. The polishing surface has formed therein one or more grooves extending in a spiral inwardly from the periphery to the center of the polishing pad. As a result, slurry is transported inwardly toward the center or toward the periphery of the polishing pad depending upon the circumferential direction of the spiral relative to the direction of rotation of the polishing pad.
申请公布号 US5690540(A) 申请公布日期 1997.11.25
申请号 US19960606418 申请日期 1996.02.23
申请人 MICRON TECHNOLOGY, INC. 发明人 ELLIOTT, RICHARD L.;WALKER, MICHAEL A.
分类号 B24B37/04;B24D13/14;(IPC1-7):B24B7/22 主分类号 B24B37/04
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