发明名称 Method of manufacturing silicon on insulating substrate
摘要 A first silicon single crystal substrate and a second silicon single crystal substrate are bonded together and the first silicon single crystal substrate is formed thin as an SOI layer. An insulation film is buried in portions of the bonding surface of one of the two silicon single crystal substrates, and in addition, a polycrystal silicon layer is formed on the bonding surface of the silicon single crystal substrate on the side into which the insulation film is buried.
申请公布号 US5691231(A) 申请公布日期 1997.11.25
申请号 US19970779226 申请日期 1997.01.07
申请人 NEC CORPORATION 发明人 KOBAYASHI, KENYA;HAMAJIMA, TOMOHIRO;OKONOGI, KENSUKE
分类号 H01L21/20;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/20
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