发明名称 TEST DEVICE, PARTICULARLY FOR A MULTICONTACT ELECTRONIC COMPONENT
摘要 A test device including means (1) for immobilising electrically insulating upper (3) and lower (4) parallel plates defining a cavity (10) and respectively comprising a plurality of third (39) and first (37) through-holes arranged in a predetermined pattern, and a plurality of elongate electrically conductive contact means (30) respectively secured to the upper plate adjacent the third through-holes, and having a calibrated length (L). The cavity (10) houses means (5, 6, 8) for controllably moving the plurality of contact means between the upper and lower plates to cause one-sided buckling of the plurality of contact means.
申请公布号 WO9743655(A1) 申请公布日期 1997.11.20
申请号 WO1997FR00854 申请日期 1997.05.14
申请人 CHASSERIEAU, CLAUDE 发明人 CHASSERIEAU, CLAUDE
分类号 G01R1/073;(IPC1-7):G01R1/073 主分类号 G01R1/073
代理机构 代理人
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