| 摘要 |
A device and method for improving a visualization of detected defects (1) in a substantially planar transparent strip (70), most preferably in a strip of a film. The device is arranged with a light source (90, 92) in order to substantially illuminate the width of the transparent strip (70), focusing means (50, 52) provided with an optical axis (100), in order to focus the light which is coming from the transparent strip (70), a detector (10, 12), in order to detect defects (1) on the transparent strip (70) and means (80) for displacing the transparent strip (70) in its longitudinal direction. The transparent strip (70) is arranged in a first plane between the light source (90, 92) and the focusing means (50, 52), and where the optical axis (100) is arranged in a second plane in order to focus the incoming light to the detector (10, 12) by means of the focusing means. The light from the light source is inclined with respect to the lateral direction of the transparent strip (70) and the light source (90, 92) is arranged in the second plane in order to obtain a high intensity.
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