发明名称 Device for measuring a level of material using microwaves
摘要 A level measuring device using microwaves comprises an antenna for sending transmitted waves toward the surface of a material whose level is to be measured, and for the reception of echo waves resulting from reflection at the surface, and a receiving and evaluating circuit which derives from the echo waves received by the antenna an echo function representative of the echo amplitudes as a function of the distance and determines from the echo function the transit time of the microwaves from the antenna to the surface of the material and therefrom the distance of the surface of the material from the antenna. In order to detect the formation of deposits of the material on the antenna or further trouble conditions, such as damage to the antenna or the loss thereof, the level measuring device comprises an arrangement which compares a section of the echo function originating from a reference reflection point in the antenna or in the vicinity of the antenna with a predetermined threshold value and produces a signal indicating the existence of a state above or below the said threshold value. The reference reflection point may be constituted by a part of the antenna or a separate reference reflector mounted in the antenna or in the vicinity thereof.
申请公布号 US5689265(A) 申请公布日期 1997.11.18
申请号 US19960728535 申请日期 1996.10.09
申请人 ENDRESS & HAUSER GMBH & CO. 发明人 OTTO, JOHANNGEORG;BURGER, STEFAN;GERST, PETER
分类号 G01F23/28;G01F23/284;G01F25/00;G01S13/88;(IPC1-7):G01S13/08 主分类号 G01F23/28
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