发明名称 Method and apparatus for testing the address system of a memory system
摘要 A method and apparatus for testing or verifying proper operation of an address system of a memory system are provided. The address system includes a write unit for driving write word lines, based on a write address, and a read unit for driving read word lines, based on a read address. A common address is applied to the write unit and read unit, and the outputs thereof are compared for equivalency, using a verification circuit. Proper operation of the address system is indicated by the verification circuit if the outputs of the write and read units are equivalent, and improper operation is indicated if the outputs are not equivalent.
申请公布号 US5689514(A) 申请公布日期 1997.11.18
申请号 US19960724573 申请日期 1996.09.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 SAITOH, TOSHIHARU
分类号 G06F11/16;G11C29/02;(IPC1-7):G06F11/00 主分类号 G06F11/16
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