发明名称 PIEZOELECTRIC THIN FILM ELEMENT, MANUFACTURE THEREOF, AND INK JET RECORDER HEAD USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To facilitate forming a thick film by the hydrothermal synthesis, raise the voltage distortion const., and forming a fine pattern by forming a piezoelectric thin film having a specified thickness, a crystal grain size and a surface roughness on a substrate. SOLUTION: A SiO2 insulation film 201 on a single crystal Si substrate 101, a Pt lower electrode 104 is formed thereon by sputtering, a specified sol is applied, baked, calcined, preannealed, and annealed with flow of oxygen in a diffusion furnace to form a PZT (piezoelectric) seed crystal 105 on the film surface by the solgel method, and a PZT film (layer) 106 is grown by the hydrothermal reaction on the PZT seed crystal 105. Thus obtained thin film 106 has a thickness of 1-10μm, a crystal grain size of 0.05-1μm, and a surface roughness Rmax of 1μm or less and is oriented in the (100) or (111) plane.</p>
申请公布号 JPH09298324(A) 申请公布日期 1997.11.18
申请号 JP19960077668 申请日期 1996.03.29
申请人 SEIKO EPSON CORP 发明人 SHIMADA KATSUTO;MURAI MASAMI;SUMI KOJI;NISHIWAKI MANABU
分类号 B41J2/045;B41J2/015;B41J2/055;B41J2/135;B41J2/14;B41J2/145;B41J2/16;H01L41/09;H01L41/22 主分类号 B41J2/045
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