发明名称
摘要 PURPOSE:To obtain a permeable base transistor of a structure where both electrodes are insulated electrically from each other even when a cathode electrode and a grid electrode are formed by evaporating a metal on a substrate where a line and a space have been formed by a method wherein a silicon dioxide layer is formed on a side wall of a groove. CONSTITUTION:In a permeable base transistor composed of cathode electrodes 12 and grid electrodes 13 which are formed on a semiconductor substrate 11 where grooves have been formed, silicon dioxide layers 15 are formed on side walls of the grooves. For example, lines and spaces are formed on an n-type Si substrate 11 by a dry etching operation; after that, an SiO2 film 15 with a thickness of 500Angstrom is formed on the whole surface by a thermal oxidation operation. Then, the SiO2 in the lines and the spaces is removed by executing the dry etching operation again; the SiO2 is left only on side walls. Then, NiS2 is evaporated to be a thickness of 100Angstrom by using an MBE method; cathode electrodes 12 and gird electrodes 13 are formed simultaneously. Lastly, AuSb is evaporated on the rear of the Si substrate 11 in order to form an anode electrode 14; a permeable base transistor is completed.
申请公布号 JP2677800(B2) 申请公布日期 1997.11.17
申请号 JP19870275706 申请日期 1987.11.02
申请人 发明人
分类号 H01L29/68;H01L29/772;H01L29/80;(IPC1-7):H01L29/80 主分类号 H01L29/68
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