发明名称 Verfahren zum Diagnostizieren einer Oberfläche und anschließendem selektiven Abtragen von Schichten
摘要 In an apparatus for the diagnosis of a surface and the subsequent selective removal of layers from the surface by a pulsed laser beam 1, areas of the surface to be diagnosed being repeatedly illuminated and the light reflected from the il-luminated surfaces being diffracted into spectral ranges whose intensities are measured and compared with standards and de-pending on this comparison layers are removed by the pulsed laser beams 1 from the surface areas diagnosed, the spaces in which the diagnosis of the surface areas and the laser irradiation procedures are performed, are spatially separated and sealed from one another so as to prevent dust and light contamination of the diagnosis space.
申请公布号 DE19619137(A1) 申请公布日期 1997.11.13
申请号 DE1996119137 申请日期 1996.05.11
申请人 URENCO DEUTSCHLAND GMBH, 52428 JUELICH, DE 发明人 SCHWEIZER, GERHARD, 52428 JUELICH, DE;WERNER, LINUS, 41462 NEUSS, DE;WIRTZ, RALF, 52428 JUELICH, DE
分类号 B23K26/03;B23K26/364;G01N21/27;(IPC1-7):G01N21/84;G01N21/47;G01N21/31;B23K26/00;G06K9/78;G01J3/30;G01J3/46 主分类号 B23K26/03
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