发明名称 |
System for testing hard disk drives |
摘要 |
A multi-testing system for a number of hard disk drives (HDDs) is described. The system includes a high temperature burn-in chamber 620 for the HDDs 644-652 and a control chamber 610, isolated from the burn-in chamber 620 by a partition wall 80, for a plurality of HDD test computers 612-618 electrically connected with the HDDs. Each test computer has a plurality of adapters 622-626 connected to it to allow data transfer between a plurality of the HDDs and the HDD test computer. A host computer 600 controls the internal environment of the burn-in chamber 620 and the HDD test computers 612-618. |
申请公布号 |
GB2312984(A) |
申请公布日期 |
1997.11.12 |
申请号 |
GB19970009491 |
申请日期 |
1997.05.12 |
申请人 |
* SAMSUNG ELECTRONICS CO LIMITED |
发明人 |
CHANG-KYU * SEO;WOON-JUK * PAEK;JEONG-MIN * KANG;DAE-GEUN * RYOO;YOUNG-BOK * SUNG;CHANG-WOO * NAM |
分类号 |
G11B33/12;G01R31/28;G06F11/24;G06F11/267;G11B20/18;G11B25/04;G11B27/36;G11B33/02;(IPC1-7):G11B27/36 |
主分类号 |
G11B33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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