发明名称 System for testing hard disk drives
摘要 A multi-testing system for a number of hard disk drives (HDDs) is described. The system includes a high temperature burn-in chamber 620 for the HDDs 644-652 and a control chamber 610, isolated from the burn-in chamber 620 by a partition wall 80, for a plurality of HDD test computers 612-618 electrically connected with the HDDs. Each test computer has a plurality of adapters 622-626 connected to it to allow data transfer between a plurality of the HDDs and the HDD test computer. A host computer 600 controls the internal environment of the burn-in chamber 620 and the HDD test computers 612-618.
申请公布号 GB2312984(A) 申请公布日期 1997.11.12
申请号 GB19970009491 申请日期 1997.05.12
申请人 * SAMSUNG ELECTRONICS CO LIMITED 发明人 CHANG-KYU * SEO;WOON-JUK * PAEK;JEONG-MIN * KANG;DAE-GEUN * RYOO;YOUNG-BOK * SUNG;CHANG-WOO * NAM
分类号 G11B33/12;G01R31/28;G06F11/24;G06F11/267;G11B20/18;G11B25/04;G11B27/36;G11B33/02;(IPC1-7):G11B27/36 主分类号 G11B33/12
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