发明名称 Method for fabricating defect-free compound semiconductor thin film on dielectric thin film
摘要 A method for fabricating a defect-free compound semiconductor thin film on a dielectric thin film which oxidizes multi-semiconductor layers consisting of a hetero compound semiconductor thin film made of one of GaAs, InGaAs or InAs over a thin film containing a carbon impurity of a high concentration and made of AlGaAs series by an annealing at a vapor ambient, thereby rapidly growing a hetero-semiconductor thin film over a dielectric thin film made of Al2O3 with no defect.
申请公布号 US5686350(A) 申请公布日期 1997.11.11
申请号 US19940350022 申请日期 1994.11.29
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 LEE, BUN;YOON, MEE-YOUNG;BAEK, JONG-HYEOB
分类号 C30B29/42;H01L21/20;H01L21/205;H01L21/316;H01L27/12;(IPC1-7):H01L21/20 主分类号 C30B29/42
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