发明名称 APPARATUS FOR DETECTING DEFECT OF TRANSLUCENT LONG BODY
摘要 PROBLEM TO BE SOLVED: To detect the defects at a comparable signal sensitivity, from the inner side to the outer side of the vicinity of the center of a material under inspection, without generating problem points regarding the dynamic range for light-receiving intensity. SOLUTION: Parallel rays 3 are projected from the direction intersecting a moving optical fiber 2. Scattered light 4 from the optical fiber 2 is received with image sensors 5a and 5b. These image sensors 5a and 5b are arranged so as to have a light-receiving angleθfrom the position, squarely facing a light projecting axis 3a of the parallel rays. The outputs of these image sensors 5a and 5b are processed in a signal processing part 6, and the distribution pattern of the scattered light intensity is obtained. The activity defects in the optical fiber 2 are judged by a judging part 7, based on the distribution pattern of the scattered light intensity.
申请公布号 JPH09292305(A) 申请公布日期 1997.11.11
申请号 JP19960105114 申请日期 1996.04.25
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 TOFUJI SHINPEI
分类号 G01N21/896;G01M11/00;G01N21/88;G01N21/89;G01N21/892;G01N21/958;(IPC1-7):G01M11/00 主分类号 G01N21/896
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