发明名称 POLISHING DEVICE FOR WAFER
摘要 PROBLEM TO BE SOLVED: To prevent polishing irregularity of a wafer by providing a rotational drive means mounted in a support base part to rotate a polishing surface plate around an axial line orthogonal to a polishing surface serving as the center relating to the support base part. SOLUTION: A rotational drive means 25 is mounted in a support base part, a polishing surface plate 10 is rotated around an axial line serving as the center relating to this support base part 22. In a circular motion device 32, the support base part 22 makes a circular motion without rotating on its own axis in a surface parallel to a polishing surface 10a relating to a base 30. This circular motion device 32 comprises an eccentric arm 34 and a circular motion motor 36. This circular motion is a motion generating an equal speed in any point on the polishing surface plate 10, any point of a wafer 20 can be polished by an equal condition. Accordingly, a surface of the wafer 20 can be very uniformly accurately polished.
申请公布号 JPH09290364(A) 申请公布日期 1997.11.11
申请号 JP19960104964 申请日期 1996.04.25
申请人 FUJIKOSHI MACH CORP 发明人 KUDO NORIO;INADA YASUO;NAKAJIMA MAKOTO;FUKUSHIMA MASANORI
分类号 B24B37/10;B24B37/12;B24B47/10;H01L21/304 主分类号 B24B37/10
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