发明名称 |
Method of manufacturing a semiconductor device having an out diffusion preventing film |
摘要 |
A method of manufacturing a semiconductor device comprises the steps of: forming an insulative film onto a semiconductor substrate; forming openings into said insulative film; implanting desired impurities into the semiconductor substrate through at least the openings; forming an out diffusion preventing film onto the surfaces of the semiconductor substrate exposed in at least the opening portions after the impurities have been implanted; annealing the semiconductor substrate after the out diffusion preventing film has been formed; and forming a conductive layer onto the out diffusion preventing film.
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申请公布号 |
US5686323(A) |
申请公布日期 |
1997.11.11 |
申请号 |
US19940203591 |
申请日期 |
1994.02.28 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
KATAOKA, YUZO |
分类号 |
H01L29/73;H01L21/223;H01L21/28;H01L21/285;H01L21/331;H01L29/732;(IPC1-7):H01L21/265;H01L21/44 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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