发明名称 Method of manufacturing a semiconductor device having an out diffusion preventing film
摘要 A method of manufacturing a semiconductor device comprises the steps of: forming an insulative film onto a semiconductor substrate; forming openings into said insulative film; implanting desired impurities into the semiconductor substrate through at least the openings; forming an out diffusion preventing film onto the surfaces of the semiconductor substrate exposed in at least the opening portions after the impurities have been implanted; annealing the semiconductor substrate after the out diffusion preventing film has been formed; and forming a conductive layer onto the out diffusion preventing film.
申请公布号 US5686323(A) 申请公布日期 1997.11.11
申请号 US19940203591 申请日期 1994.02.28
申请人 CANON KABUSHIKI KAISHA 发明人 KATAOKA, YUZO
分类号 H01L29/73;H01L21/223;H01L21/28;H01L21/285;H01L21/331;H01L29/732;(IPC1-7):H01L21/265;H01L21/44 主分类号 H01L29/73
代理机构 代理人
主权项
地址