| 发明名称 |
METHOD OF ERROR CORRECTION OF DATA BITS IN SEMICONDUCTOR MEMORIES, AND SEMICONDUCTOR MEMORY CHIP FOR CARRYING OUT SAID METHOD |
| 摘要 |
The method provides that from each memory cell in addition to the logical bit information its analogue voltage level can also be selected as a criterion for error probability of the data bit stored in said memory cell.
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| 申请公布号 |
WO9741512(A1) |
申请公布日期 |
1997.11.06 |
| 申请号 |
WO1997DE00795 |
申请日期 |
1997.04.21 |
| 申请人 |
SIEMENS AKTIENGESELLSCHAFT;SOTEK, KAREL |
发明人 |
SOTEK, KAREL |
| 分类号 |
G06F11/00;G06F11/10;(IPC1-7):G06F11/00;H03M13/00 |
主分类号 |
G06F11/00 |
| 代理机构 |
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