发明名称 APPARATUS AND METHOD FOR IMPROVED DEPOSITION OF CONFORMAL LINER FILMS AND PLUGS IN HIGH ASPECT RATIO CONTACTS
摘要 <p>A sputter deposition system and method comprises a vacuum system (36), target (44), collimator (46), and substrate (38). The target (44) is biased and sputtered to deposit a material layer onto the substrate (38) through the collimator (46). The substrate (38) can be biased to allow contemporaneous etching with deposition.</p>
申请公布号 WO1997041598(A1) 申请公布日期 1997.11.06
申请号 IB1997000522 申请日期 1997.04.15
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