发明名称 Semiconductor memory device in which a failed memory cell is replaced with another memory cell
摘要 A semiconductor memory device including a memory cell array having memory cells arranged in XY directions, means for storing at least X addresses of failure bit memory cells among memory cells defined by an X address and a Y address in the memory cell array, and address means for generating an address Xe+m (m=positive or negative integer), serving as an internal address, when X address Xe corresponding to the failure bit address is inputted from an external section.
申请公布号 US5684746(A) 申请公布日期 1997.11.04
申请号 US19950567688 申请日期 1995.12.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OOWAKI, YUKIHITO;FUKUDA, RYO
分类号 G11C11/413;G11C11/401;G11C29/00;G11C29/04;G11C29/24;H01L21/82;H01L27/10;(IPC1-7):G11C7/00 主分类号 G11C11/413
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