发明名称 Fixed resistance high density parallel ROM device
摘要 The present invention provides a fixed resistance sense-routed high density parallel ROM device for maintaining the resistance of a buried N+ region on a sense route constant. When data is read from a ROM cell matrix, the selection of different ROM cell transistors does not change the resistance of the buried N+ region on the sense route and thus enables a simplified design of a sense amplifier. The inactive select gate or transfer gate that is activated by the select line can be isolated by ion implantation for forming a buried P+ isolation and thus avoiding the narrowing or the cutting-off of the width of the active transfer gate or select gate due to ion diffusion.
申请公布号 US5684733(A) 申请公布日期 1997.11.04
申请号 US19960722303 申请日期 1996.09.30
申请人 HOLTEK MICROELECTRONICS, INC. 发明人 WU, CHI-YUNG;CHEN, LING;PENG, TONG
分类号 G11C17/12;H01L27/112;(IPC1-7):G11C13/00 主分类号 G11C17/12
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