| 摘要 |
<p>PROBLEM TO BE SOLVED: To shorten a time for product testing by releasing deselecting an address latch of a selected block into a deselected state and accessing to a memory cell array after setting all blocks into a selected state in a batch. SOLUTION: An address latch circuit provided in each block of a memory cell array latches all blocks of a memory array 4 into a selected state before deselecting address latches of the selected blocks into a deselected state. Following this, a row decoder 5 accesses the memory arrays 4 in blocks. Thus, all the blocks are latched into a selected state in a batch before an address latching of pre-examined defective blocks can be freed into a deselected state. Therefore, it is eliminated to successively select the blocks one by one except the defective ones, and testing on a batch writing, erasing, and reading of normal blocks can easily be performed.</p> |
