发明名称 Multilayered interconnection of semiconductor device
摘要 A multilayered interconnection of a semiconductor device includes a substrate, an underside interconnection layer formed on the substrate, an interlayer insulation film formed on the underside interconnection layer, an upperside interconnection layer formed on the interlayer insulation film, a contact hole formed through the upperside interconnection layer and into the interlayer insulation film, and a plug formed in the contact hole so that the plug contacts an upper part of the underside interconnection layer and a side of the upperside interconnection layer.
申请公布号 US5684331(A) 申请公布日期 1997.11.04
申请号 US19950482001 申请日期 1995.06.07
申请人 LG SEMICON CO., LTD. 发明人 JUN, YOUNG KWON
分类号 H01L21/768;H01L23/522;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/768
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