| 摘要 |
PCT No. PCT/CA94/00378 Sec. 371 Date May 9, 1996 Sec. 102(e) Date May 9, 1996 PCT Filed Jul. 13, 1994 PCT Pub. No. WO95/02859 PCT Pub. Date Jan. 26, 1995A method of improving the performance of an active semiconductor device with a voltage-controllable channel length, comprises providing a matched reference component having similar operating characteristics to the active semiconductor device, continually monitoring the breakdown voltage of the matched reference component, and maintaining the operating voltage of the active semiconductor device to lie just below the measured breakdown voltage of the matched reference component. In this way, the performance of the active component can be optimized.
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