MEASURING SYSTEM USING IMPEDANCE CT

摘要

PROBLEM TO BE SOLVED: To provide a measuring system using an impedance CT with microorganism such as cell, foreign matter such as dust or bubble or the other minute material as an object to be measured or particularly a measuring system capable of effectively measuring two- or three-dimensional tomograph of the profile structure of the infinitesimal material. SOLUTION: A hole 3 is recessed at an insulating board 2 having a suitable thickness. A plurality of electrodes 4 are formed in the state to be insulated from each other at the inner peripheral side of the hole. A plurality of leads 6 are respectively provided at the electrodes on the upper surface of the board 2. A measuring sample is disposed in the hole 3. The two electrodes are used as two current electrodes and the others are used as voltage electrodes. Tomograph information of the sample is obtained based on the potential obtained by the voltage electrode or the potential difference between the voltage electrodes obtained when a current flows to the sample via the current electrodes.