发明名称 METHOD FOR MANUFACTURING POLYCRYSTAL SILICON SUBSTRATE AND METHOD FOR MANUFACTURING THIN FILM TRANSISTOR SUBSTRATE
摘要 <p>PROBLEM TO BE SOLVED: To manufacture a polycrystal silicon substrate at a high speed using a low-cost substrate not through a dehydrogenizing step by a method wherein, after amorphous silicon is formed on the substrate by a sputtering method, this amorphous silicon is continuously heated to by polycrystalized. SOLUTION: A shield film 2 composed of a-Si is formed on a glass substrate, an undercoat film 3 is coated thereon, and an a-Si film is formed by a sputtering method. Thereafter, a polycrystal silicon 4 is formed by laser annealing to be patterned. A gate insulation film 5 is formed thereon, and further a gate electrode 6 is formed to be patterned, and with the use of the gate electrode 6 as a mask, an ion doping is performed to the polycrystal silicon, a source region 4a and a drain region 4b are formed, and besides an insulation film 7 is formed on the entire face. Further, a through hole is opened on the source region 4a and drain region 4b of the insulation film, and a source electrode 8a and a drain electrode 8b are formed to obtain a thin film transistor.</p>
申请公布号 JPH09283439(A) 申请公布日期 1997.10.31
申请号 JP19960089121 申请日期 1996.04.11
申请人 TOSHIBA CORP 发明人 RAMESHIYU KATSUKADO
分类号 G02F1/13;G02F1/136;G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 G02F1/13
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