发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the fall time of an output voltage waveform and enable high-speed operation, by bypassing electric charges charged up to a load capacitance by a bypass diode between a power-supply potential and a ground potential and reducing the resistance value only at the time of discharge. SOLUTION: In a second N-well 22 formed on a main surface of a semiconductor substrate 10, a low-density P<-> impurity diffusion region 3 and a high-density N<+> impurity diffusion region 13 are formed. An input terminal, IN is formed at a gate 1 within a first N-well 21 and an output terminal OUT is formed in a drain region 5 of the first N-well 21 and in a P<+> impurity diffusion region 9 of the second N-well 22. A control terminal, CONT is formed in the high- density N<+> impurity diffusion region 13, and a bypass diode is constituted between the control terminal CONT and the P-impurity diffusion region 3. A control voltage of the opposite phase to that of an input voltage is applied to the control terminal CONT, thus reducing the fall time of an output voltage.
申请公布号 JPH09283635(A) 申请公布日期 1997.10.31
申请号 JP19960113050 申请日期 1996.04.11
申请人 TOSHIBA CORP 发明人 OTANI SATOSHI
分类号 H01L27/06;H01L21/8234;H03K17/04;H03K19/0175 主分类号 H01L27/06
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