| 摘要 |
A test method for LCD accurately and quickly examines an LCD, and precisely checks a minute defect. The test method includes the steps of: magnifying and photographing a specific pattern displayed on LCD; sequentially converting a partial luminance value of a matrix/or segment from each light receiving cell or adjacent light receiving cell groups into a binary digital value on the basis of a predetermined level value; comparing the binary digital value with a predetermined binary data value; and successively comparing the sequentially converted digital value with a digital value centering the sequentially converted digital value.
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