发明名称 METHOD AND APPARATUS FOR PERFORMING LOCALIZED THERMAL ANALYSIS AND SUB-SURFACE IMAGING BY SCANNING THERMAL MICROSCOPY
摘要 <p>A platinum/rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few νm3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.</p>
申请公布号 WO1997040369(A1) 申请公布日期 1997.10.30
申请号 IB1997000528 申请日期 1997.04.22
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