发明名称 Fine wet etching of especially silicon substrate
摘要 A fine processing method for a substrate (1) involves: (a) forming an oxynitride layer (1a) and then a nitride layer (2) on the substrate; (b) patterning the nitride layer by etching to produce an etching mask; and (c) etching the substrate by immersion in an etching solution.
申请公布号 DE19710237(A1) 申请公布日期 1997.10.30
申请号 DE1997110237 申请日期 1997.03.12
申请人 DENSO CORP., KARIYA, AICHI, JP 发明人 TANAKA, HIROSHI, KARIYA, AICHI, JP;ABE, YOSHITSUGU, KARIYA, AICHI, JP;MATSUMOTO, KOJI, KARIYA, AICHI, JP;INOUE, KAZUYUKI, AICHI, JP
分类号 G01L1/18;H01L21/306;H01L21/308;H01L29/84;(IPC1-7):H01L21/31;H01L21/311 主分类号 G01L1/18
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