| 摘要 |
An apparatus for performing logic and leakage current tests on a logic circuit device under test (DUT) includes a local module (14) for each terminal of the DUT. For performing logic tests, each local module has a driver for supplying a logic signal input to the DUT terminal, a comparator (82) for detecting the DUT output at the terminal, and a clamping circuit (22) for limiting the voltage swing at the DUT terminal during the logic test. For performing a leakage current test, each local module (14) includes a source for supplying a parametric signal to the DUT terminal. The voltage the parametric signal produces at the DUT terminal, as detected by the comparator (82) indicates the terminal's leakage current. The parametric signal source (24) and the clamping circuit (22) are connected to the DUT terminal through Schottky diodes (52, 54). During a logic test the parametric signal source (24) is isolated from the DUT terminal by reverse biasing the Schottky diodes linking the parametric signal source (24) to the DUT terminal.
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