发明名称 Method and apparatus for trimming an electrical value of a component of an integrated circuit
摘要 An integrated circuit and method for using same is constructed on a semiconductor substrate (15) with a structure (24) in the substrate (15) having an electrical value desired to be trimable and with a conducting layer (33) on the substrate (15) insulated (30) from the structure (14) except at one location (26), which is electrically connected to a first part of the structure (24). An oxide layer (48) separates one portion of the structure (24) from a part of the conductor (33). The second oxide layer (48) has a predetermined breakdown voltage such that when a voltage, VTRIM, larger than the second predetermined breakdown voltage is applied between the conductor (33) and the structure (24), the second oxide layer (48) breaks down, shorting the first and second parts (46, 50) of the structure (24) to trim its value.
申请公布号 US5682049(A) 申请公布日期 1997.10.28
申请号 US19950510159 申请日期 1995.08.02
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 NGUYEN, BAOSON
分类号 H01L21/66;(IPC1-7):H01L29/04;H01L23/62;H01L29/00 主分类号 H01L21/66
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