发明名称 DEFECT DETECTOR AND DETECTING METHOD
摘要 PROBLEM TO BE SOLVED: To shorten a defeat detection and processing time in either a master method or a scroll method. SOLUTION: Image memories 65-68 are provide, every time when an image data input part 61 inputs image data from a signal processing and transmission part, an image change-over and control part 64 changes over the connection of a data bus and inputs the image data on the basis of an image synchronous signal outputted from the data input part 61, a positional displacement operation part 62 operates the amount of positional displacement on the basis of new positional displacement operation image data, a defect judgment part judges the defect of new detection image data, and the process is repeated.
申请公布号 JPH09277495(A) 申请公布日期 1997.10.28
申请号 JP19960313520 申请日期 1996.11.25
申请人 OMRON CORP 发明人 MATSUNAMI TAKESHI
分类号 B41F33/14;G01N21/88;G01N21/89;G01N21/892;G01N21/93 主分类号 B41F33/14
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