发明名称 |
Electron beam back-scatter distribution detector for X-ray tube anode |
摘要 |
The electron beam (4) impinges on the elongated anode (2) at a spot (6) from which X-rays (5) are emitted while electrons are backscattered (7) on to a detector (9). The amplitude and/or width of the signal are evaluated by a processor (10) from which inferences can be drawn concerning the distribution of electrons in the spot and its position on the anode. Pref. the electron detector is preceded by a collimator (11) having three offset holes so that detection is confined to a predetermined solid angle of back-scatter, and multiply-scattered electrons are excluded.
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申请公布号 |
DE19611228(C1) |
申请公布日期 |
1997.10.23 |
申请号 |
DE19961011228 |
申请日期 |
1996.03.21 |
申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
SCHARDT, PETER, DR., 91341 ROETTENBACH, DE |
分类号 |
H01J35/02;H01J35/14;H05G1/26;H05G1/52;(IPC1-7):H01J35/02 |
主分类号 |
H01J35/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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