发明名称 Electron beam back-scatter distribution detector for X-ray tube anode
摘要 The electron beam (4) impinges on the elongated anode (2) at a spot (6) from which X-rays (5) are emitted while electrons are backscattered (7) on to a detector (9). The amplitude and/or width of the signal are evaluated by a processor (10) from which inferences can be drawn concerning the distribution of electrons in the spot and its position on the anode. Pref. the electron detector is preceded by a collimator (11) having three offset holes so that detection is confined to a predetermined solid angle of back-scatter, and multiply-scattered electrons are excluded.
申请公布号 DE19611228(C1) 申请公布日期 1997.10.23
申请号 DE19961011228 申请日期 1996.03.21
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 SCHARDT, PETER, DR., 91341 ROETTENBACH, DE
分类号 H01J35/02;H01J35/14;H05G1/26;H05G1/52;(IPC1-7):H01J35/02 主分类号 H01J35/02
代理机构 代理人
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