发明名称 Appts. for deflecting electron beam relative to elongate anode esp. for X-ray computer tomography
摘要 The device causes the electron beam (2) to pass through a solenoid coil arrangement (3) parallel to the anode (1). The electron beam (2) is deflected by 90 deg. relative to the anode (1) by kick coils (4). The windings of the solenoid coil arrangement (3) are switched off in the region of the deflection. In a preferred arrangement, the device includes a current source (5) for the windings (6) of the coil arrangement (3). The windings are switched via switches (7) which are controlled by a control device (8).
申请公布号 DE19615967(A1) 申请公布日期 1997.10.23
申请号 DE19961015967 申请日期 1996.04.22
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 WEILAND, THOMAS, PROF. DR.-ING., 64285 DARMSTADT, DE
分类号 H01J35/30;(IPC1-7):H01J35/30;A61B6/03;G01N23/04 主分类号 H01J35/30
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