发明名称 Probe card and method of forming the same
摘要 <p>A probe card comprises the following elements. An insulation film is provided which is flexible and extends on a first surface of a substrate. The insulation film has a first surface in contact with the first surface of the substrate, to form a space region which is defined between the first surface of the substrate and the first surface of the insulation film so as to allow part of the insulation film to move into the space. Probe patterns extend on a second surface of the insulation film. &lt;IMAGE&gt;</p>
申请公布号 EP0802419(A2) 申请公布日期 1997.10.22
申请号 EP19970302543 申请日期 1997.04.15
申请人 NEC CORPORATION 发明人 SOEJIMA, KOJI;SENBA, NAOJI
分类号 G01R31/26;G01R1/06;G01R1/067;G01R1/073;G01R3/00;H01L21/66;(IPC1-7):G01R3/00 主分类号 G01R31/26
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