发明名称 Wafer grinding machine
摘要 The wafer grinding machine uses a centrally located robot to move a wafer from an input station to a measuring station. Thereafter, the wafer is moved into a grind station and a wash station sequentially. The robot is able to move a wafer from the wash station to either the measuring station for after-grinding measurements or directly to an output station. During grinding of one wafer, a second wafer may be held between the measuring station and the grind station while a ground wafer is moved from the wash station to the measuring station for after-grinding measurements.
申请公布号 US5679060(A) 申请公布日期 1997.10.21
申请号 US19950549969 申请日期 1995.10.30
申请人 SILICON TECHNOLOGY CORPORATION 发明人 LEONARD, THOMAS E.;PAGANO, JOHN C.
分类号 B24B37/04;B24B41/00;(IPC1-7):B24B1/00;B24B7/19;B24B7/30 主分类号 B24B37/04
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