发明名称 Device for testing multiple pulling resistor connections using a single test point
摘要 A device which comprises an electronic circuit and at least two connections, each of which is connected to a separate output of the circuit and to a separate pulling resistor. The test resistor is connected between a fixed supply voltage and a test point with the pulling resistors connected to the test point and the electronic circuit arranged to test the connections by application of test data to the connections so that a given response is formed on the test point.
申请公布号 US5680407(A) 申请公布日期 1997.10.21
申请号 US19940359369 申请日期 1994.12.20
申请人 U.S. PHILIPS CORPORATION 发明人 DE JONG, FRANCISCUS G.M.
分类号 G01R31/28;G01R31/3185;G06F11/267;(IPC1-7):G01R31/00 主分类号 G01R31/28
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