发明名称 SEMICONDUCTOR MANUFACTURE DEVICE
摘要 PROBLEM TO BE SOLVED: To detect a bonding wire effectively at high precision. SOLUTION: A bonding wire detection device 11 of a wire bonding device 10 provided with an imaging device 12 for imaging a bonding wire 5 has prisms 15A1 , 15A2 , 15B and 15C which are arranged between a bonding wire and an imaging device, and pick up an image of right and left bonding wires to a semiconductor pellet 1 which is far therefrom simultaneously and lead it to an imaging device. The imaging device 12 is constituted so that an image of right and left bonding wires to the semiconductor pellet 1 which is far therefrom can be imaged in the same visual field.
申请公布号 JPH09275122(A) 申请公布日期 1997.10.21
申请号 JP19960106085 申请日期 1996.04.01
申请人 TOSHIBA MECHATRONICS KK 发明人 MATSUDA SUSUMU
分类号 G01B11/00;G01N21/88;G01N21/956;G06T1/00;G06T7/00;H01L21/60 主分类号 G01B11/00
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