发明名称 Gunn transceiver logic input circuit for use in a semiconductor memory device
摘要 A gunn transceiver logic input circuit for use in a semiconductor memory device is capable of effectively inputting a signal having a small voltage difference. The gunn transceiver logic input circuit includes first and second input units which respectively input a GTL-level input signal and a GTL-level reference signal. First and second generating units with first and second level shifters respectively shift the GTL-level input signal and GTL-level reference signal to the ECL-level. An ECL buffer circuit compares the voltages between the ECL-level input signal and the ECL-level reference signal and generates first and second ECL-level output signals while maintaining a swing width of the GTL level signal.
申请公布号 US5680062(A) 申请公布日期 1997.10.21
申请号 US19960625112 申请日期 1996.04.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YOUNG-DAE;JUNG, CHUL-MIN;CHO, UK-RAE
分类号 H03K19/0175;(IPC1-7):H03K19/017 主分类号 H03K19/0175
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