发明名称 |
Gunn transceiver logic input circuit for use in a semiconductor memory device |
摘要 |
A gunn transceiver logic input circuit for use in a semiconductor memory device is capable of effectively inputting a signal having a small voltage difference. The gunn transceiver logic input circuit includes first and second input units which respectively input a GTL-level input signal and a GTL-level reference signal. First and second generating units with first and second level shifters respectively shift the GTL-level input signal and GTL-level reference signal to the ECL-level. An ECL buffer circuit compares the voltages between the ECL-level input signal and the ECL-level reference signal and generates first and second ECL-level output signals while maintaining a swing width of the GTL level signal.
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申请公布号 |
US5680062(A) |
申请公布日期 |
1997.10.21 |
申请号 |
US19960625112 |
申请日期 |
1996.04.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YOUNG-DAE;JUNG, CHUL-MIN;CHO, UK-RAE |
分类号 |
H03K19/0175;(IPC1-7):H03K19/017 |
主分类号 |
H03K19/0175 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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