发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a multilevel semiconductor memory device provided with a MOS type mask ROM by a method wherein a channel region is divided into a plurality of parts in self-aligned manner. SOLUTION: A polysilicon film 3 and a WSi film 4 are formed via a gate insulation film 2 on a silicon substrate 1. Next, by using an anisotropic etching method, the WSi film 4 is etched in a specific shape. Next, a silicon oxide film 5 is formed on the entire face, and by using the anisotropic etching method, a sidewall is formed. Next, by use of the WSi film 4 and the sidewall as a mask, by using the anisotropic etching method, the polysilicon film 3 is etched to form a projected gate electrode. Next, ions are implanted aslant from a specific implantation angle from the perpendicular direction with respect to the gate electrode.
申请公布号 JPH09275152(A) 申请公布日期 1997.10.21
申请号 JP19960082214 申请日期 1996.04.04
申请人 SHARP CORP 发明人 HIGUCHI MASATOMO;AOKI HITOSHI
分类号 H01L29/78;H01L21/265;H01L21/8246;H01L27/112 主分类号 H01L29/78
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