| 发明名称 |
Method and apparatus for built-in self-test with multiple clock circuits |
| 摘要 |
Built-In Self-Testing of multiple scan chains (121-12n)can be accomplished by providing separate clock signals (CK1-CKn) that are scheduled by a control circuit (22) so that each chain is clocked at its rated frequency.
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| 申请公布号 |
US5680543(A) |
申请公布日期 |
1997.10.21 |
| 申请号 |
US19950546055 |
申请日期 |
1995.10.20 |
| 申请人 |
LUCENT TECHNOLOGIES INC. |
发明人 |
BHAWMIK, SUDIPTA |
| 分类号 |
G01R31/317;G01R31/3185;(IPC1-7):G06F11/27 |
主分类号 |
G01R31/317 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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