发明名称 |
Thermal neutron shielded integrated circuits |
摘要 |
A thermal neutron shield (520) for integrated circuits (511-515) deters absorption of thermal neutrons by circuit constituents to form unstable isotopes with subsequent decay which generates bursts of charge which may upset of stored charge and create soft errors. The shielding may be either at the integrated circuit level (such as a layer on insulation or in the filler of plastic packaging material) or at the board level (such as a filler or film on a container wall). |
申请公布号 |
SG43298(A1) |
申请公布日期 |
1997.10.17 |
申请号 |
SG19960007656 |
申请日期 |
1996.04.03 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
HWANG MING;MCKEE, WILLIAM, R.;BAUMANN ROBERT |
分类号 |
H01L23/29;H01L23/31;H01L23/552;H01L23/556 |
主分类号 |
H01L23/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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