Testing and repair of embedded memory

摘要

A method and circuits for coupling a memory embedded in an integrated circuit to interconnect pads during a memory test mode is disclosed. The integrated circuit contains a processor, an embedded memory and a switching circuit for: (1) temporary coupling the interconnect pads of the integrated circuit, coupled to the processor during normal operation mode of the circuit, to the memory during a memory test mode; (2) and decoupling the external interconnect pads from the memory, after the memory is tested, and coupling them to the processor.