发明名称 Positive photoresist composition
摘要 A positive photoresist composition which is of high resolution, high sensitivity and wide focusing range and suitable for high integration of semiconductor devices and shows superior resist pattern profile, comprising quinonediazide sulfonic acid ester as a photoresist, an alkali soluble resin, a solvent, and additives, said quinonediazide sulfonic acid ester being prepared through the esterification of 1,2-naphthoquinonediazidesulfonyl halide or 1,2-benzoquinonediazidesulfonyl halide with an aromatic hydroxy compound represented by the following structural formula I: <IMAGE> (I) wherein R1 and R2 are independently hydrogen, halogen, an alkyl group or an alkoxy group; a is an integer of 1 to 3; b is an integer of 1 to 8; c is an integer of 1 to 12; and R3 is an alkyl group containing ether, mercapthane, sulfoxide, sulfone, aryl group or hydroxy group.
申请公布号 US5677103(A) 申请公布日期 1997.10.14
申请号 US19960723679 申请日期 1996.09.30
申请人 KOREA KUMHO PETROCHEMICAL CO., LTD. 发明人 KIM, SEONG-JU;PARK, JOO-HYEON;KIM, JI-HONG;PARK, SUN-YI
分类号 G03F7/022;G03F7/023;H01L21/027;(IPC1-7):G03F7/023 主分类号 G03F7/022
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