SIGNAL-TO-BE-TESTED GENERATOR AND DIGITAL DATA SIGNAL OUTPUT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a signal-to-be-tested generator for which a circuit scale is small and thus the generation probability of malfunctions is also small. SOLUTION: A parallel/serial(P/S) conversion circuit 11 converts parallel data signals PD into serial data signals SD corresponding to clock signals TC for conversion outputted from a phased locked loop(PLL) circuit 12. A sampling signal generation circuit 21 generates sampling signals SP by frequency-dividing the clock signals TC for the conversion. A D flip-flop circuit 22 generates signals CHECK to be tested by sampling the serial data signals SD corresponding to the sampling signals SP.