发明名称 SCREENING METHOD OF NONLINEAR RESISTOR
摘要 <p>PROBLEM TO BE SOLVED: To reliably and easily select only nonlinear resistors, each having an energy absorbing power above a certain level. SOLUTION: This cleaning method comprises step 1 of flowing a current having specified energy in a nonlinear resistor having electrodes, step 2 of measuring the temp. distribution over the electrode forming face when the resistor absorbs specified energy during the current flowing step 1, step 3 of computing the distribution of a caused thermal stress, based on the measured temp. distribution, and step 4 of judging if the max. value of the thermal stress on the outside of the resistor meets specified conditions determined as a selection criterion.</p>
申请公布号 JPH09270305(A) 申请公布日期 1997.10.14
申请号 JP19960077638 申请日期 1996.03.29
申请人 TOSHIBA CORP 发明人 IMAI TOSHIYA
分类号 G01R31/00;H01C7/10;H01C17/00;(IPC1-7):H01C7/10 主分类号 G01R31/00
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