发明名称 STANDARDIZED BONDING LOCATION PROCESS AND APPARATUS
摘要 A process for making a semiconductor device and the resulting device having standardized die-to-substrate bonding locations are herein disclosed. The semiconductor die (32) provides a standard ball grid or other array of a particular size, pitch and pattern such that as the size, configuration or bond pad arrangement of the die changes, a standard substrate (60) (the term including leadrames) having a similarly standardized array of terminals (62, 64) or trace ends can be employed to form a semiconductor device (30). It is also contemplated that dies having markedly different circuitry but a common array pattern may be employed with the same substrate or other carrier.
申请公布号 WO9737383(A1) 申请公布日期 1997.10.09
申请号 WO1997US05433 申请日期 1997.04.01
申请人 MICRON TECHNOLOGY, INC. 发明人 FARNWORTH, WARREN, M.;WOOD, ALAN, G.
分类号 H01L23/32;H01L21/60;H01L23/28;H01L23/498 主分类号 H01L23/32
代理机构 代理人
主权项
地址