发明名称 |
STANDARDIZED BONDING LOCATION PROCESS AND APPARATUS |
摘要 |
A process for making a semiconductor device and the resulting device having standardized die-to-substrate bonding locations are herein disclosed. The semiconductor die (32) provides a standard ball grid or other array of a particular size, pitch and pattern such that as the size, configuration or bond pad arrangement of the die changes, a standard substrate (60) (the term including leadrames) having a similarly standardized array of terminals (62, 64) or trace ends can be employed to form a semiconductor device (30). It is also contemplated that dies having markedly different circuitry but a common array pattern may be employed with the same substrate or other carrier. |
申请公布号 |
WO9737383(A1) |
申请公布日期 |
1997.10.09 |
申请号 |
WO1997US05433 |
申请日期 |
1997.04.01 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
FARNWORTH, WARREN, M.;WOOD, ALAN, G. |
分类号 |
H01L23/32;H01L21/60;H01L23/28;H01L23/498 |
主分类号 |
H01L23/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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