SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING IT,申请号JP19960074848-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING IT
摘要
申请公布号	JPH09264928(A)	申请公布日期	1997.10.07
申请号	JP19960074848	申请日期	1996.03.28
申请人	NEC CORP	发明人	OGAWA TADAHIKO
分类号	G01R31/28;H01L21/82;H01L21/822;H01L27/04;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
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