发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To finely process ferroelectric substance or platinum in a semiconductor device easily. SOLUTION: A device insulating film 2 is formed on a semiconductor substrate 1. A lower platinum film 3, a ferroelectric film 4, an upper platinum film 5 and a titanium film 6 are formed, and a desired pattern of photoresist mask 7 is formed thereon. In this case, the thickness of the titanium film 6 is made not less than one-tenth of the sum of the upper platinum film 5, the ferroelectric film 4 and the lower platinum film 3. In a dry etching step, the titanium film 6 is etched and the photoresist mask 7 is removed in an ashing treatment step. With a patterned mask of titanium 6, three laminated layers 3 to 5 are etched using a mixed gas of chlorine and 40vol% of oxygen in a dry etching step. In addition, the titanium film 6 is etched by chlorine gas plasma in the dry etching step.
申请公布号 JPH09266200(A) 申请公布日期 1997.10.07
申请号 JP19970002835 申请日期 1997.01.10
申请人 MATSUSHITA ELECTRON CORP 发明人 NAKAGAWA SATOSHI;ITO TOYOJI;BITO YOJI;NAGANO YOSHIHISA
分类号 C23F4/00;H01L21/302;H01L21/3065;H01L21/822;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/04;H01L27/105;H01L27/108;H01L29/788;H01L29/792 主分类号 C23F4/00
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