发明名称 Lead penetrating clamping system
摘要 An apparatus and method of forming improved wire bonds between the contact pads on semiconductor devices and individual lead frame fingers of a lead frame. The apparatus and method includes the use of a penetrating individual independent lead finger clamp during the wire bonding process to provide increased stability of the individual lead finger for improved bonding by the clamp penetrating a portion of the lead finger being bonded. If desired, the apparatus and method also provides for the use of either a penetrating or non-penetrating fixed clamp for the lead fingers during the wire bonding process in addition to the penetrating individual independent lead finger clamp during the wire bonding process to provide increased stability of the individual lead finger for improved bonding. The apparatus and method contemplates the replacement of the penetrating fixed clamp with another, or second, penetrating independent clamp in addition to the first individual independent lead finger clamp during the wire bonding process.
申请公布号 US5673845(A) 申请公布日期 1997.10.07
申请号 US19960631143 申请日期 1996.06.17
申请人 MICRON TECHNOLOGY, INC. 发明人 BALL, MICHAEL B.
分类号 B23K20/00;H01L21/48;H01L21/603;(IPC1-7):H01L21/60;B23K37/04 主分类号 B23K20/00
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